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Quick Overview

Silicon probe with sharp tip for high resolution imaging in force modulation mode.

f = 75 kHz   |   k = 2.8 N/m   |   tip coating: none
製品 単価 個数
SSS-FMR (50 Pack)
(Ships in 1-2 Weeks)
SSS-FMR (20 Pack)
(Ships in 1-2 Weeks)
SSS-FMR (10 Pack)
(Ships in 1-2 Weeks)


SuperSharpSilicon™- Force Modulation Mode - Reflex Coating

NANOSENSORS™ SSS-FMR AFM probes are designed for force modulation mode.
For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ tip with unrivalled sharpness.
The FM type is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. The SSS-FMR tip serves also as a basis for high resolution tips with magnetic coating (SSS-MFMR). Furthermore non-contact or tapping mode operation is possible with the FM tip but with reduced operation stability.

The probe offers unique features:
  • Guaranteed tip radius of curvature < 5 nm
  • Typical tip radius of curvature of 2 nm
  • Typical aspect ratio at 200 nm from tip apex in the order of 4:1
  • Half cone angle at 200 nm from apex < 10°
  • Monolithic material
  • Highly doped to dissipate static charge
  • Chemically inert
  • High mechanical Q-factor for high sensitivity

    Cantilever Specifications
    Spring k (N/m 3 (2 - 4)
    Freq (kHz) 75 (45 - 115)
    Length (µm) 225 (215 - 235)
    Width (µm) 30 (20 - 35)
    Thickness (µm) 2.8 (0.5 - 9.5)
    Shape rectangular
    Material Silicon
    Reflex Coating (nm) Al

    Tip Specifications
    Tip radius (nm) 2
    Tip height (µm) 12.5 +/- 2.5
    Front angle (°) 25 +/- 2
    Back angle (°) 15 +/- 2
    Side angle (°) 22.5 +/- 2
    Tip shape 4-sided
    Tip material Silicon
    Tip coating (nm) none

  • Untitled Document

    Additional Information

    Tip Radius 2
    Tip Radius 1-5 nm
    Spring Constant 2.8
    Frequency 75
    Compatibility blueDrive
    Manufacturer Nanosensors

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