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Quick Overview

Sharp conductive probe with PtSi coating for electrical measurements.

f = 330 kHz   |   k = 42 N/m   |   tip coating: PtSi

製品 単価 個数
PtSi-NCH (50 Pack)
(Ships in 1-2 Weeks)
PtSi-NCH (20 Pack)
(Ships in 1-2 Weeks)
PtSi-NCH (10 Pack)
(Ships in 1-2 Weeks)


Platinum Silicide Probes Non-Contact / Tapping Mode - High Resonance Frequency

NANOSENSORS™ PtSi-NCH probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This probe type combines high operation stability with outstanding sensitivity and fast scanning ability. For applications that require a wear resistant and an electrically conductive tip we recommend this type. NANOSENSORS PtSi probes are suitable for C-AFM, Tunneling AFM and Scanning Capacitance Microscopy (SCM).
The Platinum Silicide coating shows an excellent conductivity (almost approaching metal conductivity). The typical tip radius of curvature is around 25 nm.

The probe offers unique features:
  • Platinum silicide coating with excellent conductivity and good wear-out behavior
  • High mechanical Q-factor for high sensitivity
  • Alignment grooves on backside of silicon holder chip

    Cantilever Specifications
    Spring k (N/m 42 (10 - 130)
    Freq (kHz) 330 (204 - 497)
    Length (µm) 125 (115 - 135)
    Width (µm) 30 (22.5 - 37.5)
    Thickness (µm) 4.0 (3.0 - 5.0)
    Shape rectangular
    Material Silicon
    Reflex Coating (nm) PtSi

    Tip Specifications
    Tip radius (nm) 25 +/- 5
    Tip height (µm) 12.5 +/- 2.5
    Front angle (°) 25 +/- 2
    Back angle (°) 15 +/- 2
    Side angle (°) 22.5 +/- 2
    Tip shape 4-sided
    Tip material Silicon
    Tip coating (nm) PtSi

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    Additional Information

    Tip Radius 25
    Tip Radius > 20 nm
    Spring Constant 42
    Frequency 330
    Compatibility blueDrive
    Manufacturer Nanosensors

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