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Probes

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Items 1 to 50 of 77 total

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  1. AC10DS

    BioLever fast (also known as BL-AC10DS); ultra small cantilever for tapping mode in liquid.
    Only on AFMs with small laser spot such as Cypher.
    f = 1500 kHz   |   k = 0.1 N/m   |   tip coating: none

    Starting at: ¥49,000

  2. ASYELEC.01-R2

    Asylum electrolever with visible tip apex and conductive coating for nano-electrical measurements
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: Ti/Ir

    Starting at: ¥46,000

  3. ASYMFMLC-R2

    Silicon probe with visible tip apex and magnetic coating for low coercivity MFM applications.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: permalloy

    Starting at: ¥51,000

  4. ASYELEC.02

    Asylum electrolever with visible tip apex and conductive coating for tapping/non-contact mode.
    f = 300 kHz   |   k = 42 N/m   |   tip coating: Ti/Ir

    Starting at: ¥40,000

  5. ASYELEC.02-R2

    Asylum electrolever with visible tip apex and conductive coating for tapping/non-contact mode.
    f = 285 kHz   |   k = 42 N/m   |   tip coating: Ti/Ir

    Starting at: ¥46,000

  6. ASYMFMHC-R2

    Silicon probe with visible tip apex and magnetic coating for high coercivity MFM applications.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: CoPt/FePt

    Starting at: ¥60,000

  7. ASYMFMHM-R2

    Silicon probe with visible tip apex and magnetic coating for high moment MFM applications.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: CoCr

    Starting at: ¥51,000

  8. PtSi-FM

    Sharp conductive probe with PtSi coating for electrical measurements.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: PtSi

    Starting at: ¥223,000

  9. ASYMFMSMPL

    Five each of Asylum MFM levers (ASYMFM; ASYMFMHC-R2; ASYMFMHM; ASYMFMLC; ASYMFMLM); Veeco equiv - MESPSP

    Starting at: ¥211,000

  10. PPP-EFM

    Conductive probe for electrical measurements in force modulation mode.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: Pt/Ir

    Starting at: ¥68,000

  11. EFM

    Silicon probe with PtIr coating for force modulation.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: Pt/Ir

    Starting at: ¥58,000

  12. qp-BioAC-CI

    Quartz like probe with three cantilevers for contact mode.
    f = 30 & 50 & 90 kHz   |   k = 0.06 & 0.1 & 0.3 N/m   |   tip coating: none

    Starting at: ¥75,000

  13. PPP-MFMR

    Silicon probe coated with high moment material for MFM.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: hard magnetic

    Starting at: ¥105,000

  14. SC-10-M

    CoNi side-coated tip silicon probe for high resolution MFM.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: CoNi

    Starting at: ¥149,000

  15. NCHPt

    Silicon probe with PtIr coating for tapping/non-contact mode.
    f = 320 kHz   |   k = 42 N/m   |   tip coating: Pt/Ir

    Starting at: ¥58,000

  16. SC-35-M

    CoNi side-coated tip silicon probe for high hi-resolution MFM.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: CoNi

    Starting at: ¥109,000

  17. PPP-LM-MFMR

    Silicon probe coated with low moment material for MFM on magnetic samples.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: hard magnetic

    Starting at: ¥105,000

  18. PPP-NCHAu

    Conductive silicon probe with Au tip coating for electrical measurements in non-contact/tapping mode.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: Au

    Starting at: ¥59,000

  19. CDT-NCHR

    Silicon probe with conductive diamond coated tip for electrical measurements.
    f = 400 kHz   |   k = 80 N/m   |   tip coating: conductive diamond

    Starting at: ¥223,000

  20. SC-20-M

    CoNi side-coated tip silicon probe for high hi-resolution MFM.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: CoNi

    Starting at: ¥129,000

  21. NW-MFMR

    Silicon probe coated with high moment material for MFM.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: hard magnetic

    Starting at: ¥84,000

  22. SC-35-LM

    Ni side-coated tip silicon probe for high hi-resolution MFM.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: Ni

    Starting at: ¥123,000

  23. PPP-LC-MFMR

    Silicon probe coated with low coercivity material for MFM on soft magnetic samples.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: soft magnetic

    Starting at: ¥105,000

  24. CDT-FMR

    Silicon probe with conductive diamond coating for force modulation mode.
    f = 105 kHz   |   k = 6.2 N/m   |   tip coating: conductive diamond

    Starting at: ¥223,000

  25. NW-CDT-NCHR

    Nanoworld silicon probe with conductive diamond coating for tapping/non-contact mode.
    f = 400 kHz   |   k = 80 N/m   |   tip coating: conductive diamond

    Starting at: ¥191,000

  26. NW-CDT-FMR

    Silicon probe with conductive diamond coating for force modulation mode.
    f = 105 kHz   |   k = 6.2 N/m   |   tip coating: conductive diamond

    Starting at: ¥191,000

  27. SC-20-LM

    Ni side-coated tip silicon probe for high resolution MFM.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: Ni

    Starting at: ¥143,000

    Ships in 3 Weeks

  28. PPP-FMAu

    Conductive silicon probe with Au coating for electrical measurements.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: Au

    Starting at: ¥59,000

  29. NCLPt

    Silicon probe with long cantilever and PtIr coating for tapping/non-contact mode.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: PtIr

    Starting at: ¥58,000

  30. PtSi-NCH

    Sharp conductive probe with PtSi coating for electrical measurements.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: PtSi

    Starting at: ¥223,000

  31. CDT-CONTR

    Silicon probe with conductive diamond coated tip for electrical measurements.
    f = 20 kHz   |   k = 0.5 N/m   |   tip coating: conductive diamond

    Starting at: ¥223,000

  32. NW-CDT-NCLR

    Nanoworld silicon probe with long cantilever and conductive diamond coating for tapping/non-contact mode.
    f = 210 kHz   |   k = 72 N/m   |   tip coating: conductive diamond

    Starting at: ¥191,000

  33. PPP-NCSTAu

    Conductive probe with Au coating for soft tapping mode electrical measurements.
    f = 160 kHz   |   k = 7.4 N/m   |   tip coating: Au

    Starting at: ¥59,000

  34. PPP-NCLAu

    Conductive silicon probe with long cantilever for conductive measurements.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: Au

    Starting at: ¥59,000

  35. Arrow NCPt

    Silicon probe with PtIr coating for contact mode.
    f = 285 kHz   |   k = 42 N/m   |   tip coating: Pt/Ir

    Starting at: ¥56,000

  36. PNP-TR-Au

    Pyrex probe with two triangular gold coated nitride cantilevers and tip for life science applications.
    f = 17 & 67 kHz   |   k = 0.08 & 0.32 N/m   |   tip coating: AU(35)

    Starting at: ¥66,000

  37. ATEC-CONTAu

    Conductive silicon probe with visible tip apex for contact mode electrical measurements.
    f = 15 kHz   |   k = 0.2 N/m   |   tip coating: Au

    Starting at: ¥134,000

  38. CONTPt

    Test Conductive probe with visible tip apex for electrical measurements in contact mode.
    f = 13 kHz   |   k = 0.2 N/m   |   tip coating: Pt/Ir

    Starting at: ¥58,000

    Ships in 1-2 Weeks

  39. DT-CONTR

    Silicon probe with Al reflex coating and diamond coated tip for contact mode on tip degrading samples.
    f = 20 kHz   |   k = 0.5 N/m   |   tip coating: diamond

    Starting at: ¥179,000

  40. NW-DT-NCLR

    Silicon probe with diamond coated tip and long cantilever for tip degrading samples.
    f = 210 kHz   |   k = 72 N/m   |   tip coating: diamond

    Starting at: ¥153,000

  41. PPP-CONTSCAu

    Conductive silicon probe with short cantilever with Au tip coating for contact mode electrical measurements.
    f = 23 kHz   |   k = 0.2 N/m   |   tip coating: Au

    Starting at: ¥59,000

  42. PPP-NCLPt

    Conductive probe with long cantilever for electrical measurements.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: Pt/Ir

    Starting at: ¥68,000

  43. DT-NCLR

    Silicon probe with diamond coated tip and long cantilever for tip degrading samples.
    f = 210 kHz   |   k = 72 N/m   |   tip coating: diamond

    Starting at: ¥179,000

  44. Arrow EFM

    Silicon probe with tip at the end of cantilever and PtIr coating for force modulation mode.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: Pt/Ir

    Starting at: ¥56,000

  45. NW-DT-FMR

    Silicon probe with Al reflex coating and diamond coated tip for force modulation mode on tip degrading samples.
    f = 105 kHz   |   k = 6.2 N/m   |   tip coating: diamond

    Starting at: ¥153,000

  46. PL2-CONT

    Silicon probe with plateau tip for contact mode.
    f = 15 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: ¥134,000

  47. DT-FMR

    Silicon probe with Al reflex coating and diamond coated tip for force modulation mode on tip degrading samples.
    f = 105 kHz   |   k = 6.2 N/m   |   tip coating: diamond

    Starting at: ¥179,000

  48. PtSi-CONT

    Silicon probe with PtSi coating for contact mode
    f = 13 kHz   |   k = 0.2 N/m   |   tip coating: PtSi

    Starting at: ¥223,000

  49. PPP-NCSTPt

    Conductive probe for electrical measurements in soft tapping mode.
    f = 160 kHz   |   k = 7.4 N/m   |   tip coating: Pt/Ir

    Starting at: ¥68,000

  50. PPP-CONTPt

    Conductive probe for electrical measurements in contact mode.
    f = 13 kHz   |   k = 0.2 N/m   |   tip coating: Pt/Ir

    Starting at: ¥68,000

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Items 1 to 50 of 77 total

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