Important: Our new home for AFM probes is launching. The US and Canada is now served at estore.oxinst.us . Australia, India, Singapore, South Korea, and Taiwan are served at estore.oxinst.com . You must create a MyOI account to use the store, instructions here . If you have any questions or concerns please contact: Dominic.Paszkeicz@oxinst.com
0item(s)

カートには何もはいっていません。

Product was successfully added to your shopping cart.

Probes

Set Descending Direction

   

Items 1 to 50 of 203 total

  1. 1
  2. 2
  3. 3
  4. 4
  5. 5
  1. Arrow TL8

    Silicon probe; arrow shaped; tipless; eight levers at 250um pitch

    Starting at: ¥210,000

  2. Arrow TL2

    Silicon probe; arrow shaped; tipless; dual lever at 250um pitch

    Starting at: ¥135,000

  3. NM-RC-C

    Specially designed probes for high mechanical loads and scratch testing applications. Each probe comes with a calibrated spring constant and high resolution SEM showing the tip radius and cone angle.
    f = 750 kHz   |   k = 350 N/m   |   tip coating: diamond tip

    Starting at: ¥245,000

    Ships in 4 Weeks

  4. NM-TC

    Specially designed probes for high mechanical loads and scratch testing applications. For a similar probe but with a higher resolution tip, see NM-RC
    f = 750 kHz   |   k = 350 N/m   |   tip coating: diamond tip

    Starting at: ¥105,000

    Ships in 4 Weeks

  5. AD-0.5-AS (10 Pack)

    AD-0.5-AS (10 Pack)

    Ships in 1-2 Weeks

  6. TL-NCL

    Tipless long cantilever.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: ¥49,000

  7. PPP-XYCONTR

    Silicon probe with XY auto-alignment and Al reflective coating for contact mode.
    f = 13 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: ¥49,000

  8. SSS-QMFMR

    Silicon probe coated with thin magnetic material for high resolution MFM in vacuum.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: hard magnetic

    Starting at: ¥2,010,000

  9. PPP-XYNCHR

    Silicon probe with XY-auto-alignment probes for non-contact /tapping mode application.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: ¥49,000

  10. PNP-TR-TL-Au

    Nitride probe; tipless; 2 levers; Au reflex/tip coated

    Starting at: ¥66,000

  11. TL-FM

    Tipless cantilever.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: none

    Starting at: ¥49,000

  12. PPP-QLC-MFMR

    Silicon probe coated with low coercivity material for MFM in vacuum.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: soft magnetic

    Starting at: ¥179,000

  13. PL2-FM

    Silicon probe with plateau tip for force modulation.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: none

    Starting at: ¥134,000

  14. PPP-QNCHR

    Silicon probe with high Q and Al reflective coating for tapping/non contact mode in vacuum.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: ¥97,000

  15. Arrow TL8Au

    Silicon probe; arrow shaped; tipless; eight levers at 250um pitch; Au coated

    Starting at: ¥210,000

  16. Arrow TL1

    Silicon probe; arrow shaped; tipless; single lever

    Starting at: ¥135,000

  17. PPP-XYNCSTR

    Silicon probe with XY auto-alignment for soft tapping.
    f = 160 kHz   |   k = 7.4 N/m   |   tip coating: none

    Starting at: ¥49,000

  18. TL-NCH

    Tipless cantilever.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: ¥49,000

  19. Arrow TL2Au

    Silicon probe; arrow shaped; tipless; dual lever at 250um pitch; Au coated

    Starting at: ¥135,000

  20. PL2-FMR

    Silicon probe with plateau tip and Al reflective coating for force modulation.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: none

    Starting at: ¥134,000

  21. PNP-TR-TL

    Nitride probe; tipless; 2 levers; Au reflex coated

    Starting at: ¥61,000

  22. TL-CONT

    Tipless soft cantilever.
    f = 13 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: ¥49,000

  23. Arrow TL1Au

    Silicon probe; arrow shaped; tipless; single lever; Au coated

    Starting at: ¥135,000

  24. PL2-NCHR

    Silicon probe with plateau tip with Al reflex coating.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: ¥134,000

  25. PPP-QFMR

    High Q silicon probe with Al reflective coating for force modulation in vacuum.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: none

    Starting at: ¥97,000

  26. PL2-NCL

    Silicon probe with plateau tip.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: ¥134,000

  27. ATEC-NCPt

    Conductive probe with visible tip apex for electrical measurements.
    f = 335 kHz   |   k = 45 N/m   |   tip coating: Pt/Ir

    Starting at: ¥134,000

  28. ATEC-NCAu

    Conductive silicon probe with Au tip coating and visible tip apex.
    f = 335 kHz   |   k = 45 N/m   |   tip coating: Au

    Starting at: ¥134,000

  29. ASY.STM.PKG

    Platinum/Iridium (80/20) mechanically formed tip for STM application.
    Dia = 0.01"   |   lngth = 0.28"   |   tip material: Pt

    Starting at: ¥42,000

  30. PL2-NCLR

    Silicon probe with plateau tip with Al reflex coating.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: ¥134,000

    Ships in 1-2 Weeks

  31. PL2-NCH

    Silicon probe with plateau tip for non-contact/tapping mode.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: ¥134,000

  32. PPP-NCHPt

    Conductive probe for electrical measurements.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: Pt/Ir

    Starting at: ¥68,000

  33. NW-DT-NCLR

    Silicon probe with diamond coated tip and long cantilever for tip degrading samples.
    f = 210 kHz   |   k = 72 N/m   |   tip coating: diamond

    Starting at: ¥153,000

  34. NCLR

    Silicon probe with long cantilever and Al reflex coating for tapping/non-contact mode.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: ¥43,000

  35. ATEC-FMAu

    Conductive probe with tip visible at end of lever.
    f = 85 kHz   |   k = 2.8 N/m   |   tip coating: Au

    Starting at: ¥134,000

  36. PPP-CONTAu

    Conductive silicon probe with Au tip coating for contact mode electrical measurements.
    f = 15 kHz   |   k = 0.2 N/m   |   tip coating: Au

    Starting at: ¥59,000

  37. NW-DT-FMR

    Silicon probe with Al reflex coating and diamond coated tip for force modulation mode on tip degrading samples.
    f = 105 kHz   |   k = 6.2 N/m   |   tip coating: diamond

    Starting at: ¥153,000

  38. Arrow EFM

    Silicon probe with tip at the end of cantilever and PtIr coating for force modulation mode.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: Pt/Ir

    Starting at: ¥56,000

  39. PtSi-CONT

    Silicon probe with PtSi coating for contact mode
    f = 13 kHz   |   k = 0.2 N/m   |   tip coating: PtSi

    Starting at: ¥223,000

  40. DT-CONTR

    Silicon probe with Al reflex coating and diamond coated tip for contact mode on tip degrading samples.
    f = 20 kHz   |   k = 0.5 N/m   |   tip coating: diamond

    Starting at: ¥179,000

  41. SSS-NCL

    Silicon probe with sharp tip and long cantilever for high resolution imaging in tapping/non-contact mode.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: ¥114,000

  42. NW-AR5-NCLR

    Silicon probe with high aspect ratio tip (>5) for deep trench imaging.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: ¥115,000

  43. PPP-CONTSCPt

    Conductive probe with short cantilever for electrical measurements in contact mode.
    f = 23 kHz   |   k = 0.2 N/m   |   tip coating: Pt/Ir

    Starting at: ¥68,000

  44. DT-NCLR

    Silicon probe with diamond coated tip and long cantilever for tip degrading samples.
    f = 210 kHz   |   k = 72 N/m   |   tip coating: diamond

    Starting at: ¥179,000

  45. PL2-CONTR

    Silicon probe with Al reflective coating and plateau tip for contact mode.
    f = 15 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: ¥134,000

  46. PPP-NCLPt

    Conductive probe with long cantilever for electrical measurements.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: Pt/Ir

    Starting at: ¥68,000

  47. NW-DT-NCHR

    Silicon probe with diamond coated tip for tapping/non-contact mode on tip degrading samples.
    f = 400 kHz   |   k = 80 N/m   |   tip coating: diamond

    Starting at: ¥153,000

  48. DT-FMR

    Silicon probe with Al reflex coating and diamond coated tip for force modulation mode on tip degrading samples.
    f = 105 kHz   |   k = 6.2 N/m   |   tip coating: diamond

    Starting at: ¥179,000

  49. SSS-NCLR

    Silicon probe with sharp tip and long cantilever for high resolution imaging in tapping/non-contact mode.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: ¥114,000

  50. PPP-CONTSCAu

    Conductive silicon probe with short cantilever with Au tip coating for contact mode electrical measurements.
    f = 23 kHz   |   k = 0.2 N/m   |   tip coating: Au

    Starting at: ¥59,000

Set Descending Direction

   

Items 1 to 50 of 203 total

  1. 1
  2. 2
  3. 3
  4. 4
  5. 5