Important: Our new home for AFM probes is launching. The US and Canada is now served at estore.oxinst.us . Australia, India, Singapore, South Korea, and Taiwan are served at estore.oxinst.com . You must create a MyOI account to use the store, instructions here . If you have any questions or concerns please contact: Dominic.Paszkeicz@oxinst.com
0item(s)

カートには何もはいっていません。

Product was successfully added to your shopping cart.

Probes

Set Ascending Direction

   

15 Item(s)

  1. AC240TM-R3

    Also known as OSCM; conductive probe with visible apex tip for electrical measurement.
    f = 70 kHz   |   k = 2 N/m   |   tip coating: Ti/Pt

    Starting at: ¥52,000

  2. PtSi-FM

    Sharp conductive probe with PtSi coating for electrical measurements.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: PtSi

    Starting at: ¥223,000

  3. AD-40-SS

    Tapping mode probe with a super sharp conductive single crystal diamond tip for high resolution topography and electrical imaging with long tip lifetime.
    f = 180 kHz   |   k = 40 N/m   |   tip coating: diamond tip

    Starting at: ¥189,000

    Ships in 4 Weeks

  4. AD-2.8-SS

    Force modulation with an apex sharp conductive single crystal diamond tip for high resolution topography and electrical imaging with long tip lifetime.
    f = 65 kHz   |   k = 2.8 N/m   |   tip coating: diamond tip

    Starting at: ¥189,000

    Ships in 4 Weeks

  5. AD-40-AS

    with an apex sharp conductive single crystal diamond tip for high resolution topography and electrical imaging with long tip lifetime.
    f = 180 kHz   |   k = 40 N/m   |   tip coating: diamond tip

    Starting at: ¥126,000

    Ships in 4 Weeks

  6. AD-2.8-AS

    Force modulation probe with an apex sharp conductive single crystal diamond tip for high resolution topography and electrical imaging with long tip lifetime.
    f = 65 kHz   |   k = 2.8 N/m   |   tip coating: diamond tip

    Starting at: ¥126,000

    Ships in 4 Weeks

  7. PPP-EFM

    Conductive probe for electrical measurements in force modulation mode.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: Pt/Ir

    Starting at: ¥68,000

  8. CDT-FMR

    Silicon probe with conductive diamond coating for force modulation mode.
    f = 105 kHz   |   k = 6.2 N/m   |   tip coating: conductive diamond

    Starting at: ¥223,000

  9. NW-CDT-NCHR

    Nanoworld silicon probe with conductive diamond coating for tapping/non-contact mode.
    f = 400 kHz   |   k = 80 N/m   |   tip coating: conductive diamond

    Starting at: ¥191,000

  10. ATEC-EFM

    Conductive probe with visible tip apex for electrical measurements in modulation mode.
    f = 85 kHz   |   k = 2.8 N/m   |   tip coating: Pt/Ir

    Starting at: ¥134,000

  11. CDT-NCHR

    Silicon probe with conductive diamond coated tip for electrical measurements.
    f = 400 kHz   |   k = 80 N/m   |   tip coating: conductive diamond

    Starting at: ¥223,000

  12. NW-CDT-FMR

    Silicon probe with conductive diamond coating for force modulation mode.
    f = 105 kHz   |   k = 6.2 N/m   |   tip coating: conductive diamond

    Starting at: ¥191,000

  13. NW-CDT-NCLR

    Nanoworld silicon probe with long cantilever and conductive diamond coating for tapping/non-contact mode.
    f = 210 kHz   |   k = 72 N/m   |   tip coating: conductive diamond

    Starting at: ¥191,000

  14. CDT-NCLR

    Silicon probe with conductive diamond coated tip and long cantilever for electrical measurements.
    f = 210 kHz   |   k = 72 N/m   |   tip coating: conductive diamond

    Starting at: ¥223,000

  15. PPP-NCSTPt

    Conductive probe for electrical measurements in soft tapping mode.
    f = 160 kHz   |   k = 7.4 N/m   |   tip coating: Pt/Ir

    Starting at: ¥68,000

Set Ascending Direction

   

15 Item(s)