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PPP-NCH

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Quick Overview

Silicon probe with no reflex coating for tapping/non contact mode.

f = 330 kHz   |   k = 42 N/m   |   tip coating: none
製品 単価 個数
PPP-NCH (50 Pack)
(Ships in 1-2 Weeks)
¥191,000
PPP-NCH (20 Pack)
(Ships in 1-2 Weeks)
¥87,000
PPP-NCH (10 Pack)
(Ships in 1-2 Weeks)
¥49,000

Details

PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
NANOSENSORS™ PPP-NCH AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This type of AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.

The probe offers unique features:
• Guaranteed tip radius of curvature < 10nm
• Tip height 10 - 15 µm
• Highly doped silicon to dissipate static charge
• Chemically inert
• High mechanical Q-factor for high sensitivity


Cantilever Specifications
Spring k (N/m 42 (10 - 130)
Freq (kHz) 330 (204 - 497)
Length (µm) 125 (115 - 135)
Width (µm) 30 (22.5 - 37.5)
Thickness (µm) 4.0 (3.0 - 5.0)
Shape Rectangular
Material Silicon
Reflex Coating (nm) None

Tip Specifications
Tip radius (nm) 7
Tip height (µm) 12.5 +/- 2.5
Front angle (°) 25 +/- 2
Back angle (°) 15 +/- 2
Side angle (°) 22.5 +/- 2
Tip shape 4-sided
Tip material Silicon
Tip coating (nm) None

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Additional Information

Tip Radius 7
Tip Radius 5-10 nm
Spring Constant 42
Frequency 330
Compatibility No
Manufacturer Nanosensors

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