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PPP-CONT

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Quick Overview

Silicon probe without reflective coating for contact mode.

f = 15 kHz   |   k = 0.2 N/m   |   tip coating: none
製品 単価 個数
PPP-CONT (50 Pack)
(Ships in 1-2 Weeks)
¥191,000
PPP-CONT (20 Pack)
(Ships in 1-2 Weeks)
¥87,000
PPP-CONT (10 Pack)
(Ships in 1-2 Weeks)
¥49,000

Details

PointProbe® Plus Contact Mode

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
NANOSENSORS™ PPP-CONT AFM probes are designed for contact mode (repulsive mode) AFM imaging. This AFM probe can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.

The probe offers unique features:
  • guaranteed tip radius of curvature < 10 nm
  • tip height 10 - 15 µm
  • highly doped silicon to dissipate static charge
  • chemically inert
  • high mechanical Q-factor for high sensitivity


    Cantilever Specifications
    Spring k (N/m 0.2 (0.02 - 0.77)
    Freq (kHz) 13 (6 - 21)
    Length (µm) 450 (440 - 460)
    Width (µm) 50 (42.5 - 57.5)
    Thickness (µm) 2.0 (1.0 - 3.0)
    Shape rectangular
    Material Silicon
    Reflex Coating (nm) none

    Tip Specifications
    Tip radius (nm) 7
    Tip height (µm) 12.5 +/- 2.5
    Front angle (°) 25 +/- 2
    Back angle (°) 15 +/- 2
    Side angle (°) 22.5 +/- 2
    Tip shape 4-sided
    Tip material Silicon
    Tip coating (nm) none

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    Additional Information

    Tip Radius 7
    Tip Radius 5-10 nm
    Spring Constant 0.2
    Frequency 15
    Compatibility No
    Manufacturer Nanosensors

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