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Quick Overview

Silicon probe with Al reflective coating and plateau tip for contact mode.

f = 15 kHz   |   k = 0.2 N/m   |   tip coating: none
製品 単価 個数
PL2-CONTR (10 Pack)
(Ships in 1-2 Weeks)


PLateau Tip - Contact Mode - Reflex Coating

The Plateau Tip series based on the well-established NANOSENSORS™ Silicon-SPM-Probes exhibit an intentionally blunt tip with a well-defined circular end-face located at the free end of a micromechanical cantilever. This plateau is formed by focused ion beam milling out of a symmetrically etched tip building a rod on top of a conical tip.
NANOSENSORS™ PL2-CONTR AFM probes are designed for contact mode (repulsive mode) AFM imaging. This probe can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.

Cantilever Specifications
Spring k (N/m 0.2 (0.02 - 0.77)
Freq (kHz) 13 (6 - 21)
Length (µm) 450 (440 - 460)
Width (µm) 50 (42 - 57)
Thickness (µm) 2 (1.0 - 3)
Shape rectangular
Material Silicon
Reflex Coating (nm) None

Tip Specifications
Tip radius (nm) -
Tip height (µm) 12.5 +/- 2.5
Front angle (°) 20 +/- 2
Back angle (°) 20 +/- 2
Side angle (°) 20 +/- 2
Tip shape 8-sided
Tip material Silicon
Tip coating (nm) none

Tip Spike Specifications
Spike radius (nm) 900 +/- 250
Spike height (µm) >2
Spike tilt (°) 0 +/- 1
Spike ½ angle (°) 0 +/- 1
Spike shape post
Spike material Silicon

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Additional Information

Tip Radius 900
Tip Radius > 20 nm
Spring Constant 0.2
Frequency 15
Compatibility No
Manufacturer Nanosensors

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