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Probes

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Items 101 to 150 of 203 total

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  1. PPP-FMAuD

    Silicon probe with Au reflective coating for force modulation.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: none

    Starting at: ¥49,000

  2. AR5-NCHR

    Silicon probe with high aspect ratio tip (>5) for deep trench imaging.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: ¥134,000

  3. NW-MFMR

    Silicon probe coated with high moment material for MFM.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: hard magnetic

    Starting at: ¥84,000

  4. PPP-CONTSCAuD

    Silicon probe with short cantilever and Au reflective coating for contact mode.
    f = 23 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: ¥49,000

  5. 25PT400B

    Solid platinum probe for electrical measurements.
    f = 10 kHz   |   k = 8 N/m   |   tip material: Pt

    Starting at: ¥102,000

  6. AR10-NCH

    Silicon probe with high aspect ratio tip (>10) for deep trench imaging.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: ¥201,000

  7. Arrow FM

    Silicon probe with tip at the end of cantilever and no reflex coating for force modulation mode.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: none

    Starting at: ¥41,000

  8. PPP-NCLR

    Silicon probe with long cantilever and Al reflective coating for tapping/non contact mode.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: ¥49,000

  9. SC-20-M

    CoNi side-coated tip silicon probe for high hi-resolution MFM.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: CoNi

    Starting at: ¥129,000

  10. CONTR

    Silicon probe with Al reflex coating for contact mode.
    f = 13 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: ¥43,000

  11. ATEC-CONT

    Silicon probe with visible tip apex for contact mode.
    f = 15 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: ¥68,000

  12. ATEC-EFM

    Conductive probe with visible tip apex for electrical measurements in modulation mode.
    f = 85 kHz   |   k = 2.8 N/m   |   tip coating: Pt/Ir

    Starting at: ¥134,000

  13. AR5T-NCH

    Silicon probe with high aspect ratio tip (>5) for deep trench imaging.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: ¥201,000

  14. USC-F2-k3

    Quartz-like material probe with carbon EBD tip for high speed imaging in tapping/non-contact mode.
    To be used only on AFMs with small laser spot
    f = 2000 kHz   |   k = 3 N/m   |   tip coating: none

    Starting at: ¥134,000

  15. NW-CDT-NCHR

    Nanoworld silicon probe with conductive diamond coating for tapping/non-contact mode.
    f = 400 kHz   |   k = 80 N/m   |   tip coating: conductive diamond

    Starting at: ¥191,000

  16. AR10T-NCHR

    Silicon probe with high aspect ratio tip (>10) for deep trench imaging.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: ¥301,000

  17. NW-CDT-FMR

    Silicon probe with conductive diamond coating for force modulation mode.
    f = 105 kHz   |   k = 6.2 N/m   |   tip coating: conductive diamond

    Starting at: ¥191,000

  18. 25PT300B

    Solid platinum probe for electrical measurements.
    f = 20 kHz   |   k = 18 N/m   |   tip material: Pt

    Starting at: ¥54,000

  19. AR5-NCL

    Silicon probe with high aspect ratio tip (>5) for deep trench imaging.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: ¥134,000

  20. ATEC-CONTAu

    Conductive silicon probe with visible tip apex for contact mode electrical measurements.
    f = 15 kHz   |   k = 0.2 N/m   |   tip coating: Au

    Starting at: ¥134,000

  21. Arrow NCR

    Silicon probe with tip at the end of cantilever and Al reflex coating for tapping/non-contact mode.
    f = 285 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: ¥41,000

  22. PNP-TR-Au

    Pyrex probe with two triangular gold coated nitride cantilevers and tip for life science applications.
    f = 17 & 67 kHz   |   k = 0.08 & 0.32 N/m   |   tip coating: AU(35)

    Starting at: ¥66,000

  23. CDT-CONTR

    Silicon probe with conductive diamond coated tip for electrical measurements.
    f = 20 kHz   |   k = 0.5 N/m   |   tip coating: conductive diamond

    Starting at: ¥223,000

  24. PPP-FMAu

    Conductive silicon probe with Au coating for electrical measurements.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: Au

    Starting at: ¥59,000

  25. NCLPt

    Silicon probe with long cantilever and PtIr coating for tapping/non-contact mode.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: PtIr

    Starting at: ¥58,000

  26. PtSi-NCH

    Sharp conductive probe with PtSi coating for electrical measurements.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: PtSi

    Starting at: ¥223,000

  27. PNP-TR

    Pyrex probe with two triangular nitride cantilevers and tip for life science applications.
    f = 17 & 67 kHz   |   k = 0.08 & 0.32 N/m   |   tip coating: none

    Starting at: ¥61,000

  28. NW-AR10-NCHR

    Silicon probe with high aspect ratio tip (>10) for deep trench imaging.
    f = 320 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: ¥172,000

  29. AR5-NCLR

    Silicon probe with high aspect ratio tip (>5) for deep trench imaging.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: ¥134,000

  30. NW-CDT-NCLR

    Nanoworld silicon probe with long cantilever and conductive diamond coating for tapping/non-contact mode.
    f = 210 kHz   |   k = 72 N/m   |   tip coating: conductive diamond

    Starting at: ¥191,000

  31. PNP-TRS

    Pyrex probe with single nitride cantilever and tip for bio applications
    f = 67 kHz   |   k =0.32 N/m   |   tip coating: none

    Starting at: ¥61,000

    Ships in 1-2 Weeks

  32. Arrow CONT

    Silicon probe with tip at the end of cantilever and no reflex coating for contact mode.
    f = 14 kHz   |   k =0.2 N/m   |   tip coating: none

    Starting at: ¥41,000

  33. Arrow NCPt

    Silicon probe with PtIr coating for contact mode.
    f = 285 kHz   |   k = 42 N/m   |   tip coating: Pt/Ir

    Starting at: ¥56,000

  34. USC-F1.5-k0.6

    Quartz-like material probe with carbon EBD tip for high speed imaging in tapping/non-contact mode.
    To be used only on AFMs with small laser spot
    f = 1500 kHz   |   k = 0.6 N/m   |   tip coating: none

    Starting at: ¥134,000

  35. NW-AR5-NCHR

    Silicon probe with high aspect ratio tip (>5) for deep trench imaging.
    f = 320 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: ¥115,000

  36. PPP-NCSTAu

    Conductive probe with Au coating for soft tapping mode electrical measurements.
    f = 160 kHz   |   k = 7.4 N/m   |   tip coating: Au

    Starting at: ¥59,000

  37. Arrow NC

    Silicon probe with tip at the end of cantilever and no reflex coating for tapping/non-contact mode.
    f = 285 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: ¥41,000

  38. PPP-CONTSC

    Silicon probe with short cantilever without reflective coating for contact mode.
    f = 23 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: ¥49,000

  39. PNP-DB

    Pyrex probe with two diving board nitride cantilevers and tip for life science applications.
    f = 17 & 67 kHz   |   k = 0.06 & 0.48 N/m   |   tip coating: none

    Starting at: ¥61,000

  40. PPP-NCLAu

    Conductive silicon probe with long cantilever for conductive measurements.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: Au

    Starting at: ¥59,000

  41. Arrow CONTR

    Silicon probe with tip at the end of cantilever and AL reflex coating for contact mode.
    f = 14 kHz   |   k =0.2 N/m   |   tip coating: none

    Starting at: ¥41,000

  42. NW-DT-NCLR

    Silicon probe with diamond coated tip and long cantilever for tip degrading samples.
    f = 210 kHz   |   k = 72 N/m   |   tip coating: diamond

    Starting at: ¥153,000

  43. DT-NCLR

    Silicon probe with diamond coated tip and long cantilever for tip degrading samples.
    f = 210 kHz   |   k = 72 N/m   |   tip coating: diamond

    Starting at: ¥179,000

  44. NW-S-MFMR

    Silicon probe coated with low moment material for MFM.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: soft magnetic

    Starting at: ¥84,000

  45. CONTPt

    Test Conductive probe with visible tip apex for electrical measurements in contact mode.
    f = 13 kHz   |   k = 0.2 N/m   |   tip coating: Pt/Ir

    Starting at: ¥58,000

    Ships in 1-2 Weeks

  46. PtSi-CONT

    Silicon probe with PtSi coating for contact mode
    f = 13 kHz   |   k = 0.2 N/m   |   tip coating: PtSi

    Starting at: ¥223,000

  47. PPP-NCLPt

    Conductive probe with long cantilever for electrical measurements.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: Pt/Ir

    Starting at: ¥68,000

  48. NW-AR5-NCLR

    Silicon probe with high aspect ratio tip (>5) for deep trench imaging.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: ¥115,000

  49. DT-FMR

    Silicon probe with Al reflex coating and diamond coated tip for force modulation mode on tip degrading samples.
    f = 105 kHz   |   k = 6.2 N/m   |   tip coating: diamond

    Starting at: ¥179,000

  50. NW-DT-FMR

    Silicon probe with Al reflex coating and diamond coated tip for force modulation mode on tip degrading samples.
    f = 105 kHz   |   k = 6.2 N/m   |   tip coating: diamond

    Starting at: ¥153,000

Set Ascending Direction

   

Items 101 to 150 of 203 total

  1. 1
  2. 2
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