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Probes

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Items 51 to 100 of 203 total

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  1. AD-40-SS

    Tapping mode probe with a super sharp conductive single crystal diamond tip for high resolution topography and electrical imaging with long tip lifetime.
    f = 180 kHz   |   k = 40 N/m   |   tip coating: diamond tip

    Starting at: ¥189,000

    Ships in 4 Weeks

  2. SSS-FMR

    Silicon probe with sharp tip for high resolution imaging in force modulation mode.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: none

    Starting at: ¥114,000

  3. PPP-NCHAuD

    Silicon probe with Au reflex coating for tapping/non contact mode.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: ¥49,000

  4. PPP-MFMR

    Silicon probe coated with high moment material for MFM.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: hard magnetic

    Starting at: ¥105,000

  5. biotool high resolution

    200 nm long carbon tip with 2 nm radius on soft qp-BioAC probe; Designed for gentle, high resolution bioimaging.
    f = 50 kHz   |   k = 0.1 N/m   |   tip coating: none

    Starting at: ¥78,000

    Ships in 3 Weeks

  6. NCST

    Silicon probe with no reflex coating for soft tapping mode.
    f = 160 kHz   |   k = 7.4 N/m   |   tip coating: none

    Starting at: ¥43,000

  7. ATEC-NC

    Silicon probe with visible tip apex.
    f = 335 kHz   |   k = 45 N/m   |   tip coating: none

    Starting at: ¥68,000

  8. PPP-FM

    Silicon probe with no reflective coating for force modulation.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: none

    Starting at: ¥49,000

  9. NCHPt

    Silicon probe with PtIr coating for tapping/non-contact mode.
    f = 320 kHz   |   k = 42 N/m   |   tip coating: Pt/Ir

    Starting at: ¥58,000

  10. FMR

    Silicon probe with Al reflex coating for force modulation mode.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: none

    Starting at: ¥43,000

  11. AD-2.8-SS

    Force modulation with an apex sharp conductive single crystal diamond tip for high resolution topography and electrical imaging with long tip lifetime.
    f = 65 kHz   |   k = 2.8 N/m   |   tip coating: diamond tip

    Starting at: ¥189,000

    Ships in 4 Weeks

  12. SC-10-M

    CoNi side-coated tip silicon probe for high resolution MFM.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: CoNi

    Starting at: ¥149,000

  13. EBD-RTESPA

    EBD-TESPA: Diamond-like carbon probe with unrivaled lifetime. For uninterrupted AFM operation in tapping and non-contact mode in air.
    f = 320 kHz   |   k = 40 N/m   |   tip coating: none

    Starting at: ¥48,000

    Ships in 1-2 Weeks

  14. NCHR

    Silicon probe with Al reflex coating for tapping/non-contact mode.
    f = 320 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: ¥43,000

  15. PPP-LC-MFMR

    Silicon probe coated with low coercivity material for MFM on soft magnetic samples.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: soft magnetic

    Starting at: ¥105,000

  16. CDT-NCHR

    Silicon probe with conductive diamond coated tip for electrical measurements.
    f = 400 kHz   |   k = 80 N/m   |   tip coating: conductive diamond

    Starting at: ¥223,000

  17. 12PT300B

    Solid platinum probe for electrical measurements.
    f = 9 kHz   |   k = 0.8 N/m   |   tip material: Pt

    Starting at: ¥54,000

  18. AR10-NCHR

    Silicon probe with high aspect ratio tip (>10) for deep trench imaging.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: ¥201,000

  19. PPP-CONTAuD

    Silicon probe with Au reflective coating for contact mode.
    f = 15 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: ¥49,000

  20. Arrow FMR

    Silicon probe with tip at the end of cantilever and Al reflex coating for force modulation mode.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: none

    Starting at: ¥41,000

  21. SSS-NCH

    Silicon probe with sharp tip for high resolution imaging in tapping/non-contact mode.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: ¥114,000

  22. SC-35-LM

    Ni side-coated tip silicon probe for high hi-resolution MFM.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: Ni

    Starting at: ¥123,000

  23. CONTSC

    Silicon probe with short cantilever and no reflex coating for contact mode.
    f = 23 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: ¥43,000

  24. PPP-NCSTAuD

    Silicon probe with Au reflective coating for soft tapping mode.
    f = 160 kHz   |   k = 7.4 N/m   |   tip coating: none

    Starting at: ¥49,000

  25. AR5T-NCHR

    Silicon probe with high aspect ratio tip (>5) for deep trench imaging.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: ¥201,000

  26. USC-F0.3-k0.3

    Quartz-like material probe with carbon EBD tip for high speed imaging in tapping/non-contact mode.
    To be used only on AFMs with small laser spot
    f = 300 kHz   |   k = 0.3 N/m   |   tip coating: none

    Starting at: ¥134,000

  27. AR5-NCH

    Silicon probe with high aspect ratio tip (>5) for deep trench imaging.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: ¥134,000

  28. USC-F1.2-k0.15

    Quartz-like material probe with carbon EBD tip for high speed imaging in tapping/non-contact mode.
    To be used only on AFMs with small laser spot
    f = 1200 kHz   |   k = 0.15 N/m   |   tip coating: none

    Starting at: ¥134,000

    Ships in 1-2 Weeks

  29. ATEC-FM

    Silicon probe with tip visible at end of lever for force modulation.
    f = 85 kHz   |   k = 2.8 N/m   |   tip coating: none

    Starting at: ¥68,000

  30. 12PT400B

    Solid platinum probe for electrical measurements.
    f = 4.5 kHz   |   k = 0.3 N/m   |   tip material: Pt

    Starting at: ¥54,000

  31. PPP-NCLAuD

    Silicon probe with long cantilevr and Au reflective coating for tapping/non contact mode.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: ¥49,000

  32. SC-20-LM

    Ni side-coated tip silicon probe for high resolution MFM.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: Ni

    Starting at: ¥143,000

    Ships in 3 Weeks

  33. CONT

    Silicon probe with no reflex coating for contact mode.
    f = 13 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: ¥43,000

  34. USC-F1.2-k7.3

    Quartz-like material probe with carbon EBD tip for high speed imaging in tapping/non-contact mode.
    To be used only on AFMs with small laser spot
    f = 1200 kHz   |   k = 7.3 N/m   |   tip coating: none

    Starting at: ¥134,000

  35. PPP-NCHAu

    Conductive silicon probe with Au tip coating for electrical measurements in non-contact/tapping mode.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: Au

    Starting at: ¥59,000

  36. PPP-LM-MFMR

    Silicon probe coated with low moment material for MFM on magnetic samples.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: hard magnetic

    Starting at: ¥105,000

  37. PPP-RT-FMR

    Silicon probe with rotated tip for force modulation.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: none

    Starting at: ¥49,000

  38. USC-F5-k30

    Quartz-like material probe with carbon EBD tip for high speed imaging in tapping/non-contact mode.
    To be used only on AFMs with small laser spot
    f = 5000 kHz   |   k = 30 N/m   |   tip coating: none

    Starting at: ¥134,000

  39. PPP-RT-CONTR

    Silicon probe with rotated tip and Al reflective coating for contact mode.
    f = 13 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: ¥49,000

  40. PPP-CONTR

    Silicon probe with Al reflective coating for contact mode.
    f = 15 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: ¥49,000

  41. PPP-RT-NCHR

    Silicon probe with rotated tip and Al reflective coating for tapping/non contact mode.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: ¥49,000

  42. SSS-NCHR

    Silicon probe with sharp tip for high resolution imaging in tapping/non-contact mode.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: ¥114,000

  43. SC-35-M

    CoNi side-coated tip silicon probe for high hi-resolution MFM.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: CoNi

    Starting at: ¥109,000

  44. CONTSCR

    Silicon probe with short cantilever for contact mode.
    f = 23 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: ¥43,000

  45. PPP-NCL

    Silicon probe with long cantilever for tapping/non contact mode.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: ¥49,000

  46. SSS-MFMR

    Silicon probe coated with thin magnetic material for high resolution MFM.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: hard magnetic

    Starting at: ¥179,000

  47. NW-AR5T-NCHR

    Silicon probe with high aspect ratio tip (>5) for deep trench imaging.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: ¥172,000

  48. NCH

    Silicon probe with no reflex coating for tapping/non-contact mode.
    f = 320 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: ¥43,000

  49. 25Pt200B-H

    Solid platinum probe for electrical measurements.
    f = 100 kHz   |   k = 250 N/m   |   tip material: Pt

    Starting at: ¥54,000

    In Stock

  50. CDT-FMR

    Silicon probe with conductive diamond coating for force modulation mode.
    f = 105 kHz   |   k = 6.2 N/m   |   tip coating: conductive diamond

    Starting at: ¥223,000

Set Ascending Direction

   

Items 51 to 100 of 203 total

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