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Probes

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31 Item(s)

  1. ASYELEC.01-R2

    Asylum electrolever with visible tip apex and conductive coating for nano-electrical measurements
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: Ti/Ir

    Starting at: ¥46,000

  2. AC240TM-R3

    Also known as OSCM; conductive probe with visible apex tip for electrical measurement.
    f = 70 kHz   |   k = 2 N/m   |   tip coating: Ti/Pt

    Starting at: ¥52,000

  3. ASYELEC.02-R2

    Asylum electrolever with visible tip apex and conductive coating for tapping/non-contact mode.
    f = 285 kHz   |   k = 42 N/m   |   tip coating: Ti/Ir

    Starting at: ¥46,000

  4. PtSi-FM

    Sharp conductive probe with PtSi coating for electrical measurements.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: PtSi

    Starting at: ¥223,000

  5. ASYELEC.02

    Asylum electrolever with visible tip apex and conductive coating for tapping/non-contact mode.
    f = 300 kHz   |   k = 42 N/m   |   tip coating: Ti/Ir

    Starting at: ¥40,000

  6. AD-40-AS

    with an apex sharp conductive single crystal diamond tip for high resolution topography and electrical imaging with long tip lifetime.
    f = 180 kHz   |   k = 40 N/m   |   tip coating: diamond tip

    Starting at: ¥126,000

    Ships in 4 Weeks

  7. EFM

    Silicon probe with PtIr coating for force modulation.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: Pt/Ir

    Starting at: ¥58,000

  8. AD-2.8-AS

    Force modulation probe with an apex sharp conductive single crystal diamond tip for high resolution topography and electrical imaging with long tip lifetime.
    f = 65 kHz   |   k = 2.8 N/m   |   tip coating: diamond tip

    Starting at: ¥126,000

    Ships in 4 Weeks

  9. NCHPt

    Silicon probe with PtIr coating for tapping/non-contact mode.
    f = 320 kHz   |   k = 42 N/m   |   tip coating: Pt/Ir

    Starting at: ¥58,000

  10. AD-40-SS

    Tapping mode probe with a super sharp conductive single crystal diamond tip for high resolution topography and electrical imaging with long tip lifetime.
    f = 180 kHz   |   k = 40 N/m   |   tip coating: diamond tip

    Starting at: ¥189,000

    Ships in 4 Weeks

  11. AD-2.8-SS

    Force modulation with an apex sharp conductive single crystal diamond tip for high resolution topography and electrical imaging with long tip lifetime.
    f = 65 kHz   |   k = 2.8 N/m   |   tip coating: diamond tip

    Starting at: ¥189,000

    Ships in 4 Weeks

  12. CDT-FMR

    Silicon probe with conductive diamond coating for force modulation mode.
    f = 105 kHz   |   k = 6.2 N/m   |   tip coating: conductive diamond

    Starting at: ¥223,000

  13. NW-CDT-NCHR

    Nanoworld silicon probe with conductive diamond coating for tapping/non-contact mode.
    f = 400 kHz   |   k = 80 N/m   |   tip coating: conductive diamond

    Starting at: ¥191,000

  14. ATEC-EFM

    Conductive probe with visible tip apex for electrical measurements in modulation mode.
    f = 85 kHz   |   k = 2.8 N/m   |   tip coating: Pt/Ir

    Starting at: ¥134,000

  15. 25PT300B

    Solid platinum probe for electrical measurements.
    f = 20 kHz   |   k = 18 N/m   |   tip material: Pt

    Starting at: ¥54,000

  16. PPP-NCHAu

    Conductive silicon probe with Au tip coating for electrical measurements in non-contact/tapping mode.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: Au

    Starting at: ¥59,000

  17. NW-CDT-NCLR

    Nanoworld silicon probe with long cantilever and conductive diamond coating for tapping/non-contact mode.
    f = 210 kHz   |   k = 72 N/m   |   tip coating: conductive diamond

    Starting at: ¥191,000

  18. PPP-NCLAu

    Conductive silicon probe with long cantilever for conductive measurements.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: Au

    Starting at: ¥59,000

  19. PPP-FMAu

    Conductive silicon probe with Au coating for electrical measurements.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: Au

    Starting at: ¥59,000

  20. Arrow NCPt

    Silicon probe with PtIr coating for contact mode.
    f = 285 kHz   |   k = 42 N/m   |   tip coating: Pt/Ir

    Starting at: ¥56,000

  21. CDT-CONTR

    Silicon probe with conductive diamond coated tip for electrical measurements.
    f = 20 kHz   |   k = 0.5 N/m   |   tip coating: conductive diamond

    Starting at: ¥223,000

  22. NCLPt

    Silicon probe with long cantilever and PtIr coating for tapping/non-contact mode.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: PtIr

    Starting at: ¥58,000

  23. PtSi-NCH

    Sharp conductive probe with PtSi coating for electrical measurements.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: PtSi

    Starting at: ¥223,000

  24. PPP-CONTAu

    Conductive silicon probe with Au tip coating for contact mode electrical measurements.
    f = 15 kHz   |   k = 0.2 N/m   |   tip coating: Au

    Starting at: ¥59,000

  25. PPP-NCSTPt

    Conductive probe for electrical measurements in soft tapping mode.
    f = 160 kHz   |   k = 7.4 N/m   |   tip coating: Pt/Ir

    Starting at: ¥68,000

  26. Arrow EFM

    Silicon probe with tip at the end of cantilever and PtIr coating for force modulation mode.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: Pt/Ir

    Starting at: ¥56,000

  27. PPP-NCHPt

    Conductive probe for electrical measurements.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: Pt/Ir

    Starting at: ¥68,000

  28. PPP-CONTSCAu

    Conductive silicon probe with short cantilever with Au tip coating for contact mode electrical measurements.
    f = 23 kHz   |   k = 0.2 N/m   |   tip coating: Au

    Starting at: ¥59,000

  29. PPP-NCLPt

    Conductive probe with long cantilever for electrical measurements.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: Pt/Ir

    Starting at: ¥68,000

  30. ATEC-NCPt

    Conductive probe with visible tip apex for electrical measurements.
    f = 335 kHz   |   k = 45 N/m   |   tip coating: Pt/Ir

    Starting at: ¥134,000

  31. ATEC-NCAu

    Conductive silicon probe with Au tip coating and visible tip apex.
    f = 335 kHz   |   k = 45 N/m   |   tip coating: Au

    Starting at: ¥134,000

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31 Item(s)