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Probes

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36 Item(s)

  1. ASYELEC.01-R2

    Asylum electrolever with visible tip apex and conductive coating for nano-electrical measurements
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: Ti/Ir

    Starting at: ¥46,000

  2. AC240TM-R3

    Also known as OSCM; conductive probe with visible apex tip for electrical measurement.
    f = 70 kHz   |   k = 2 N/m   |   tip coating: Ti/Pt

    Starting at: ¥52,000

  3. ASYELEC.02-R2

    Asylum electrolever with visible tip apex and conductive coating for tapping/non-contact mode.
    f = 285 kHz   |   k = 42 N/m   |   tip coating: Ti/Ir

    Starting at: ¥46,000

  4. PtSi-FM

    Sharp conductive probe with PtSi coating for electrical measurements.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: PtSi

    Starting at: ¥223,000

  5. ASYELEC.02

    Asylum electrolever with visible tip apex and conductive coating for tapping/non-contact mode.
    f = 300 kHz   |   k = 42 N/m   |   tip coating: Ti/Ir

    Starting at: ¥40,000

  6. PPP-EFM

    Conductive probe for electrical measurements in force modulation mode.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: Pt/Ir

    Starting at: ¥68,000

  7. AD-2.8-AS

    Force modulation probe with an apex sharp conductive single crystal diamond tip for high resolution topography and electrical imaging with long tip lifetime.
    f = 65 kHz   |   k = 2.8 N/m   |   tip coating: diamond tip

    Starting at: ¥126,000

    Ships in 4 Weeks

  8. EFM

    Silicon probe with PtIr coating for force modulation.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: Pt/Ir

    Starting at: ¥58,000

  9. AD-2.8-SS

    Force modulation with an apex sharp conductive single crystal diamond tip for high resolution topography and electrical imaging with long tip lifetime.
    f = 65 kHz   |   k = 2.8 N/m   |   tip coating: diamond tip

    Starting at: ¥189,000

    Ships in 4 Weeks

  10. 25PT400B

    Solid platinum probe for electrical measurements.
    f = 10 kHz   |   k = 8 N/m   |   tip material: Pt

    Starting at: ¥102,000

  11. NW-CDT-NCHR

    Nanoworld silicon probe with conductive diamond coating for tapping/non-contact mode.
    f = 400 kHz   |   k = 80 N/m   |   tip coating: conductive diamond

    Starting at: ¥191,000

  12. 25PT300B

    Solid platinum probe for electrical measurements.
    f = 20 kHz   |   k = 18 N/m   |   tip material: Pt

    Starting at: ¥54,000

  13. CDT-FMR

    Silicon probe with conductive diamond coating for force modulation mode.
    f = 105 kHz   |   k = 6.2 N/m   |   tip coating: conductive diamond

    Starting at: ¥223,000

  14. 12PT300B

    Solid platinum probe for electrical measurements.
    f = 9 kHz   |   k = 0.8 N/m   |   tip material: Pt

    Starting at: ¥54,000

  15. 25Pt200B-H

    Solid platinum probe for electrical measurements.
    f = 100 kHz   |   k = 250 N/m   |   tip material: Pt

    Starting at: ¥54,000

    In Stock

  16. 12PT400B

    Solid platinum probe for electrical measurements.
    f = 4.5 kHz   |   k = 0.3 N/m   |   tip material: Pt

    Starting at: ¥54,000

  17. CDT-NCHR

    Silicon probe with conductive diamond coated tip for electrical measurements.
    f = 400 kHz   |   k = 80 N/m   |   tip coating: conductive diamond

    Starting at: ¥223,000

  18. ATEC-EFM

    Conductive probe with visible tip apex for electrical measurements in modulation mode.
    f = 85 kHz   |   k = 2.8 N/m   |   tip coating: Pt/Ir

    Starting at: ¥134,000

  19. NW-CDT-FMR

    Silicon probe with conductive diamond coating for force modulation mode.
    f = 105 kHz   |   k = 6.2 N/m   |   tip coating: conductive diamond

    Starting at: ¥191,000

  20. NW-CDT-NCLR

    Nanoworld silicon probe with long cantilever and conductive diamond coating for tapping/non-contact mode.
    f = 210 kHz   |   k = 72 N/m   |   tip coating: conductive diamond

    Starting at: ¥191,000

  21. ATEC-CONTAu

    Conductive silicon probe with visible tip apex for contact mode electrical measurements.
    f = 15 kHz   |   k = 0.2 N/m   |   tip coating: Au

    Starting at: ¥134,000

  22. CDT-CONTR

    Silicon probe with conductive diamond coated tip for electrical measurements.
    f = 20 kHz   |   k = 0.5 N/m   |   tip coating: conductive diamond

    Starting at: ¥223,000

  23. CONTPt

    Test Conductive probe with visible tip apex for electrical measurements in contact mode.
    f = 13 kHz   |   k = 0.2 N/m   |   tip coating: Pt/Ir

    Starting at: ¥58,000

    Ships in 1-2 Weeks

  24. CDT-NCLR

    Silicon probe with conductive diamond coated tip and long cantilever for electrical measurements.
    f = 210 kHz   |   k = 72 N/m   |   tip coating: conductive diamond

    Starting at: ¥223,000

  25. PPP-CONTAu

    Conductive silicon probe with Au tip coating for contact mode electrical measurements.
    f = 15 kHz   |   k = 0.2 N/m   |   tip coating: Au

    Starting at: ¥59,000

  26. Arrow CONTPt

    Silicon probe with tip at the end of cantilever and PtIr coating for contact mode.
    f = 14 kHz   |   k =0.2 N/m   |   tip coating: PtIr

    Starting at: ¥56,000

  27. PPP-CONTPt

    Conductive probe for electrical measurements in contact mode.
    f = 13 kHz   |   k = 0.2 N/m   |   tip coating: Pt/Ir

    Starting at: ¥68,000

  28. PtSi-CONT

    Silicon probe with PtSi coating for contact mode
    f = 13 kHz   |   k = 0.2 N/m   |   tip coating: PtSi

    Starting at: ¥223,000

  29. ATEC-FMAu

    Conductive probe with tip visible at end of lever.
    f = 85 kHz   |   k = 2.8 N/m   |   tip coating: Au

    Starting at: ¥134,000

  30. PPP-NCSTPt

    Conductive probe for electrical measurements in soft tapping mode.
    f = 160 kHz   |   k = 7.4 N/m   |   tip coating: Pt/Ir

    Starting at: ¥68,000

  31. ATEC-CONTPt

    Conductive probe with visible tip apex for electrical measurements in contact mode.
    f = 15 kHz   |   k = 0.2 N/m   |   tip coating: Pt/Ir

    Starting at: ¥134,000

  32. PPP-CONTSCAu

    Conductive silicon probe with short cantilever with Au tip coating for contact mode electrical measurements.
    f = 23 kHz   |   k = 0.2 N/m   |   tip coating: Au

    Starting at: ¥59,000

  33. Arrow EFM

    Silicon probe with tip at the end of cantilever and PtIr coating for force modulation mode.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: Pt/Ir

    Starting at: ¥56,000

  34. PPP-CONTSCPt

    Conductive probe with short cantilever for electrical measurements in contact mode.
    f = 23 kHz   |   k = 0.2 N/m   |   tip coating: Pt/Ir

    Starting at: ¥68,000

  35. NM-RC-C

    Specially designed probes for high mechanical loads and scratch testing applications. Each probe comes with a calibrated spring constant and high resolution SEM showing the tip radius and cone angle.
    f = 750 kHz   |   k = 350 N/m   |   tip coating: diamond tip

    Starting at: ¥245,000

    Ships in 4 Weeks

  36. NM-TC

    Specially designed probes for high mechanical loads and scratch testing applications. For a similar probe but with a higher resolution tip, see NM-RC
    f = 750 kHz   |   k = 350 N/m   |   tip coating: diamond tip

    Starting at: ¥105,000

    Ships in 4 Weeks

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36 Item(s)