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Arrow FM

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Quick Overview

Silicon probe with tip at the end of cantilever and no reflex coating for force modulation mode.

f = 75 kHz   |   k = 2.8 N/m   |   tip coating: none
製品 単価 個数
Arrow FM (50 Pack)
(Ships in 1-2 Weeks)
¥161,000
Arrow FM (20 Pack)
(Ships in 1-2 Weeks)
¥73,000
Arrow FM (10 Pack)
(Ships in 1-2 Weeks)
¥41,000

Details

Force Modulation Mode
NanoWorld Arrow™ FM probes are designed for Force Modulation Mode imaging. The Force Constant of the FM type fills the gap between Contact and Non-Contact probes. Furthermore Non-Contact / TappingMode™ imaging is possible with this AFM probe.
All SPM and AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. These probes feature a rectangular cantilever with a triangular free end and a tetrahedral tip with a typical height of 10 - 15 µm.
Additionally, this probe offers a tip radius of curvature of less than 10 nm.
The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the tip on the area of interest.


Cantilever Specifications
Spring k (N/m 2.8 (1.4 - 5.8)
Freq (kHz) 75 (58 - 97)
Length (µm) 240 (235 - 245)
Width (µm) 35 (30 - 40)
Thickness (µm) 3.0 (2.5 - 3.5)
Shape rectangular
Material Silicon
Reflex Coating (nm) none

Tip Specifications
Tip radius (nm) 10 +/- 2
Tip height (µm) 12.5 +/- 2.5
Front angle (°) 20 +/- 1
Back angle (°) 35 +/- 1
Side angle (°) 30 +/- 1
Tip shape 3-sided
Tip material Silicon
Tip coating (nm) none

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Additional Information

Tip Radius 10
Tip Radius 5-10 nm
Spring Constant 2.8
Frequency 75
Compatibility No
Manufacturer Nanoworld

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