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Quick Overview

Silicon probe with conductive diamond coating for force modulation mode.

f = 105 kHz   |   k = 6.2 N/m   |   tip coating: conductive diamond

製品 単価 個数
NW-CDT-FMR (Wafer)
(Ships in 1-2 Weeks)
NW-CDT-FMR (50 Pack)
(Ships in 1-2 Weeks)
NW-CDT-FMR (20 Pack)
(Ships in 1-2 Weeks)
NW.CDT-FMR (10 Pack)
(Ships in 1-2 Weeks)


Conductive Diamond Coated Tip - Force Modulation Mode - Reflex Coating

NanoWorld Pointprobe® CDT-FMR probes are designed for force modulation microscopy. The force constant of this probe type spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. The FM sensor serves also as a basis for magnetic coatings. Furthermore non-contact or tapping mode operation is possible with the FM probe but with reduced operation stability.
For applications that require a wear resistant and an electrically conductive tip we recommend this type. Some applications are Tunneling AFM and Scanning Capacitance Microscopy (SCM). The CDT Diamond Coating is highly doped and the total resistance measured in contact to a platinium surface is < 10 kOhm.
The typical macroscopic tip radius of curvature is between 100 and 200 nm. Nanoroughness in the 10 nm regime improves the resolution on flat surfaces.

Cantilever Specifications
Spring k (N/m) 6.2 (1.5 -18.3)
Freq (kHz) 105 (65 -155)
Length (µm) 225 (215 - 235)
Width (µm) 27.5 (20 - 35)
Thickness (µm) 3.0 (2.0 - 4.0)
Shape rectangular
Material Silicon
Reflex Coating (nm) Al (30)

Tip Specifications
Tip radius (nm) 150 +/- 50
Tip height (µm) 12.5 +/- 2.5
Front angle (°) 25 +/- 2
Back angle (°) 15 +/- 2
Side angle (°) 22.5 +/- 2
Tip shape 4-sided
Tip material Silicon
Tip coating (nm) doped diamond (100)

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Additional Information

Tip Radius 150
Tip Radius > 20 nm
Spring Constant 6.2
Frequency 105
Compatibility No
Manufacturer Nanoworld

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